Nanoestructuras y su caracterización por medio  de microscopía electrónica de transmisión;  ciencia y arte

Miriam Carolina Mendoza Ramirez; Miguel Avalos Borja

doi:10.22201/ceiich.24485691e.2020.25.69630

Miriam Carolina Mendoza Ramirez Instituto Potosino de Investigacion Cientifica y Tecnologica
Miguel Avalos Borja Instituto Potosino de Investigacion Cientifica y Tecnologica

DOI: https://doi.org/10.22201/ceiich.24485691e.2020.25.69630

Palabras clave: microscopía electrónica de transmisión, difracción de electrones, precesión y haz convergente

Resumen

En el presente trabajo se describen de forma didáctica los alcances de la Microscopia Electrónica de Transmisión (TEM) para el estudio de nanosistemas. Para ilustrar el uso de las técnicas TEM, se utilizaron nanopartículas de Au y películas de Si adelgazadas con iones.
Se describen técnicas de estudio convencional en TEM, como campo claro (BF), camp obscuro (DF), HAADF, SAED y EELS; además se mencionan las ventajas que ofrece el empleo de técnicas menos convencionales como CBED, LACBED y PED. También se brindan algunas sugerencias prácticas que permitirán describir y diferenciar de forma sencilla el contraste observado en las distintas técnicas disponibles en el TEM con el objetivo de ofrecer una visión, llamativa, clara y didáctica de los alcances actuales de la microscopia electrónica en México.

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